
Design and Test for Multiple Gbps Communication Devices and Systems
Format: Soft-Cover or CD-ROM, 497 pages
ISBN: 978-1-931695-34-3
Price: $80.00

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| Overview · Table of Contents · Executive Editor · Features · Testimonials · |
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Testimonials
Praise for Design and Test for Multiple Gbps Communication Devices and Systems:
"Difficult, knotty, intractable problems attract determined, unflagging, and very, very practical individuals like the hardy band of high-speed adventurers Mike Li has brought together in this extraordinary volume. If you are planning a multi-Gigabit project, or you just built one and it doesn't work, listen to the voices in this book-the voices of experience."
"Design and Test for Multiple Gbps Communication Devices and Systems covers the state-of-the-art knowledge in high-speed wireline communication including system architecture, design, simulation, and testing. It is the best and most impressive collection of information so far in this area. Dr. Li very thoroughly examines all aspects of the topic. A good understanding of the subjects presented here will give an engineer solid background to design and test high-speed serial interfaces."
| - Dan Yaklin Distinguished Member Technical Staff Texas Instruments | - Dr. Wenliang Chen Senior Member Technical Staff Texas Instruments |
"Design and test for multiple Gbps are two tightly coupled subjects, and this book by Dr. Li brings readers the latest and systematical overview of technologies and innovations in these two and other relevant fields. I give my highest remark for this book not only because of the importance of the subject and contents presented, but also its unique, state-of-the-art, latest, in-depth, quantitative, and thorough treatments for design and test at Gbps rates."
"This book deals with the latest and outstanding practical physical-layer issues and solutions of high-speed communication systems. Widely ranging topics in different disciplines such as Tx/Rx architecture, EM modeling, entire-path simulation, system-level jitter transfer modeling, jitter measurement with model-based inversion, etc. are discussed in an orderly and comprehensive manner. Readers will benefit a lot from Dr. Li's effort and vision in integrating these topics into a single book with a clear and coherent logical flow."